Statistical Inference on Accelerated Odd Fréchet Half-Logistic Distribution under Progressive Type-II Adaptive Hybrid Censoring with Application to Dielectric Circuits Using Binomial Removals
DOI:
https://doi.org/10.19139/soic-2310-5070-3558Keywords:
progressive-stress; progressive type-II adaptive hybrid censoring; maximum likelihood estimation; Bayes estimation simulation study.Abstract
This research presents a statistical work, where the sample is under a progressive stress-accelerated life test (PSALT) generated from the odd Fréchet half-logistic distribution (OFHLD) under adaptive progressive type-II hybrid censored (AP-II-HC) samples. The cumulative exposure model is applied to generate incremental stress samples. Both classical and Bayesian methodologies are used to estimate the unknown parameters of the distribution. Furthermore, the reliability function of the OFHLD is also calculated. The Metropolis-Hastings( MH) algorithm is applied to generate samples from the distribution. Moreover, the asymptotic and bootstrap confidence intervals (CIs) are constructed. A real data set is analyzed to illustrate the methodologies suggested in this study. Finally, some intriguing conclusions are noted and associated with future work suggestions.Downloads
Published
2026-06-07
How to Cite
Almetwally, E. M., Alzubaidi, S., Sobh, T., & Hossam, E. (2026). Statistical Inference on Accelerated Odd Fréchet Half-Logistic Distribution under Progressive Type-II Adaptive Hybrid Censoring with Application to Dielectric Circuits Using Binomial Removals. Statistics, Optimization & Information Computing, 16(1), 542–566. https://doi.org/10.19139/soic-2310-5070-3558
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Copyright (c) 2026 Ehab M. Almetwally, Samirah Alzubaidi, Taher Sobh, Eslam Hossam

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