SMIT, Neill. Bayesian accelerated life testing models for the log-normal and gamma distributions under dual-stresses. Statistics, Optimization & Information Computing, [S. l.], v. 13, n. 6, p. 2339–2352, 2025. DOI: 10.19139/soic-2310-5070-2293. Disponível em: https://iapress.org/index.php/soic/article/view/2293. Acesso em: 7 may. 2026.