MD. EYAMIN MOLLA; MD. ANWAR HUSSEN WADUD; MD RAKIBUR RAHMAN ZIHAD; T.M. AMIR UL HAQUE BHUIYAN; MD. MAHBUB-OR-RASHID; AZGAR, Ali; MD. SADDAM HOSSAIN; ISLAM BABAR, Jahirul. In-Depth Exploration of Industry-Level Deep Learning Model for Brain Anomaly Detection. Statistics, Optimization & Information Computing, [S. l.], v. 14, n. 4, p. 1918–1935, 2025. DOI: 10.19139/soic-2310-5070-2269. Disponível em: https://iapress.org/index.php/soic/article/view/2269. Acesso em: 28 apr. 2026.